手机知网 App
24小时专家级知识服务
打 开
无线电电子学
Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis
The propagation of single-event effects(SEEs)on a Xilinx Zynq-7000 system on chip(SoC) was investigated using heavy-ion microbeam radiation. The irradiation results reveal several functional blocks' sensitivity locations and cross sections, for instance, the arithmetic logic unit, register, D-cache, and peripheral, while irradiating the on-chip memory(OCM) region. Moreover, event tree analysis was executed based on the obtained microbeam irradiation results. This study quantitatively assesses the probabilities of SEE propagation from the OCM to other blocks in the SoC.
0 17
开通会员更优惠,尊享更多权益
手机阅读本文
下载APP 手机查看本文
Nuclear Science and Techniques
2021年10期
论文一键智能排版
排版交给我们,时间留给研究
立即查看 >
相似文献
图书推荐
相关工具书

搜 索