手机知网 App
24小时专家级知识服务
打 开
手机知网|搜索

A New Way of Detecting Reconvergent Fanout Branch Pairs in Logic Circuits

E.Edirisuriya

  Reconvergent fanout has been one of the critical issues for testing of VLSI circuits and design for testability. In this paper we will present a new algorithm, which will detect all sources of reconvergent fanout branch pairs by processing a normal circuit description. The algorithm identifies all the gates at which reconvergence occurs, the reconvergent sites, and lists all the reconvergent fanout branch pairs that are reconvergent at these sites. The automatic detection of such reconvergence can be used for improving the testability analysis or assist test generation of circuits containing such fanout branches.……   
[关键词]:Fanout;Fanout branch;Reconvergence;Testability;Complexity
[文献类型]:会议论文
[文献出处]: 《第三届中国测试学术会议论文集2004年
App内打开